文献
J-GLOBAL ID:201702221863766063
整理番号:17A1723071
XUVビームの焦点での線形および非線形過程によって生成されたイオン分布を画像化するためのツールとしてのイオン顕微鏡【Powered by NICT】
The ion microscope as a tool for imaging the ion distribution produced by linear and non-linear processes at the focus of an XUV beam
著者 (11件):
Tsatrafyllis N.
(Foundation for Research and Technology-Hellas, Institute of Electronic Structure & Laser, GR-71110 Heraklion (Crete), Greece)
,
Bergues B.
(Max-Planck-Institut fur Quantenoptik, D-85748 Garching, Germany)
,
Schroeder H.
(Max-Planck-Institut fur Quantenoptik, D-85748 Garching, Germany)
,
Veisz L.
(Max-Planck-Institut fur Quantenoptik, D-85748 Garching, Germany)
,
Skantzakis E.
(Foundation for Research and Technology-Hellas, Institute of Electronic Structure & Laser, GR-71110 Heraklion (Crete), Greece)
,
Gray D.
(Foundation for Research and Technology-Hellas, Institute of Electronic Structure & Laser, GR-71110 Heraklion (Crete), Greece)
,
Bodi B.
(Foundation for Research and Technology-Hellas, Institute of Electronic Structure & Laser, GR-71110 Heraklion (Crete), Greece)
,
Kuhn S.
(ELI-ALPS, ELI-Hu kft. Dugonics ter 13, H-6720 Szeged Hungary)
,
Tsakiris G. D.
(Max-Planck-Institut fur Quantenoptik, D-85748 Garching, Germany)
,
Charalambidis D.
(Foundation for Research and Technology-Hellas, Institute of Electronic Structure & Laser, GR-71110 Heraklion (Crete), Greece)
,
Tzallas P.
(Foundation for Research and Technology-Hellas, Institute of Electronic Structure & Laser, GR-71110 Heraklion (Crete), Greece)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
CLEO/Europe-EQEC
ページ:
1
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)