文献
J-GLOBAL ID:201702222001315303
整理番号:17A0400503
NBTI反応拡散とトラッピング/デトラッピングモデルのための解析的パラメータ抽出【Powered by NICT】
Analytical parameter extraction for NBTI reaction diffusion and trapping/detrapping models
著者 (9件):
Wang YanLing
(Department of Electronics Engineering, Shanghai Key Laboratory of Multidimensional Information Processing, East China Normal University, Shanghai, China)
,
Li XiaoJin
(Department of Electronics Engineering, Shanghai Key Laboratory of Multidimensional Information Processing, East China Normal University, Shanghai, China)
,
Qing Jian
(Department of Electronics Engineering, Shanghai Key Laboratory of Multidimensional Information Processing, East China Normal University, Shanghai, China)
,
Zeng Yan
(Department of Electronics Engineering, Shanghai Key Laboratory of Multidimensional Information Processing, East China Normal University, Shanghai, China)
,
Shi YanLing
(Department of Electronics Engineering, Shanghai Key Laboratory of Multidimensional Information Processing, East China Normal University, Shanghai, China)
,
Guo Ao
(Shanghai Integrated Circuit Research & Development Center, Shanghai, China)
,
Hu ShaoJian
(Shanghai Integrated Circuit Research & Development Center, Shanghai, China)
,
Chen Shoumian
(Shanghai Integrated Circuit Research & Development Center, Shanghai, China)
,
Zhao Yuhang
(Shanghai Integrated Circuit Research & Development Center, Shanghai, China)
資料名:
Microelectronics Reliability
(Microelectronics Reliability)
巻:
66
ページ:
10-15
発行年:
2016年
JST資料番号:
C0530A
ISSN:
0026-2714
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)