文献
J-GLOBAL ID:201702222197604248
整理番号:17A0451234
単層グラフェン界面材料の熱的キャラクタリゼーションのためのその場2段階Raman温度測定【Powered by NICT】
In-situ two-step Raman thermometry for thermal characterization of monolayer graphene interface material
著者 (7件):
Zhao Wenqiang
(School of Power and Mechanical Engineering, Wuhan University, Wuhan, Hubei 430072, China)
,
Zhao Wenqiang
(Henan Pinggao Electric CO., Ltd, State Grid, Pingdingshan, Hehan 467000, China)
,
Chen Wen
(School of Power and Mechanical Engineering, Wuhan University, Wuhan, Hubei 430072, China)
,
Yue Yanan
(School of Power and Mechanical Engineering, Wuhan University, Wuhan, Hubei 430072, China)
,
Yue Yanan
(State Laboratory of Hydraulic Machinery Transients, Ministry of Education, Wuhan, Hubei 430072, China)
,
Wu Shijing
(School of Power and Mechanical Engineering, Wuhan University, Wuhan, Hubei 430072, China)
,
Wu Shijing
(Key Laboratory of Water Jet Theory and New Technology of Hubei Province, Wuhan University, Wuhan, Hubei 430072, China)
資料名:
Applied Thermal Engineering
(Applied Thermal Engineering)
巻:
113
ページ:
481-489
発行年:
2017年
JST資料番号:
E0667B
ISSN:
1359-4311
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)