文献
J-GLOBAL ID:201702223289313708
整理番号:17A0402935
a-Si:Hのアンテナ基板距離を調節することにより制御するラジカルとイオンc-Si表面不動態化のための平面誘導結合プラズマ(ICP)を用いたH蒸着【Powered by NICT】
Radicals and ions controlling by adjusting the antenna-substrate distance in a-Si:H deposition using a planar ICP for c-Si surface passivation
著者 (8件):
Zhou H.P.
(School of Energy Science and Engineering, University of Electronic Science and Technology of China, 2006 Xiyuan Ave., West High-Tech Zone, Chengdu, Sichuan, 611731, China)
,
Zhou H.P.
(Plasma Sources and Application Center, NIE, and Institute of Advanced Studies, Nanyang Technological University, 637616, Singapore)
,
Xu S.
(Plasma Sources and Application Center, NIE, and Institute of Advanced Studies, Nanyang Technological University, 637616, Singapore)
,
Xu M.
(Key Laboratory of Information Materials of Sichuan Province & School of Electrical and Information Engineering, Southwest University for Nationalities, Chengdu, 610041, China)
,
Xu L.X.
(Plasma Sources and Application Center, NIE, and Institute of Advanced Studies, Nanyang Technological University, 637616, Singapore)
,
Wei D.Y.
(Plasma Sources and Application Center, NIE, and Institute of Advanced Studies, Nanyang Technological University, 637616, Singapore)
,
Xiang Y.
(School of Energy Science and Engineering, University of Electronic Science and Technology of China, 2006 Xiyuan Ave., West High-Tech Zone, Chengdu, Sichuan, 611731, China)
,
Xiao S.Q.
(Key Laboratory of Advanced Process Control for Light Industry (Ministry of Education), Department of Electronic Engineering, Jiangnan University, Wuxi, 214122, China)
資料名:
Applied Surface Science
(Applied Surface Science)
巻:
396
ページ:
926-932
発行年:
2017年
JST資料番号:
B0707B
ISSN:
0169-4332
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)