文献
J-GLOBAL ID:201702224451493330
整理番号:17A0825230
28nm FDSOIフリップフロップ設計のSEU性能の評価【Powered by NICT】
Evaluation of SEU Performance of 28-nm FDSOI Flip-Flop Designs
著者 (14件):
Wang H.-B.
(College of IOT Engineering, Hohai University, Changzhou, China)
,
Kauppila J. S.
(Vanderbilt University, Nashville, TN, USA)
,
Lilja K.
(Robust Chip Inc., Pleasanton, CA, USA)
,
Bounasser M.
(Robust Chip Inc., Pleasanton, CA, USA)
,
Chen L.
(Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, SK, Canada)
,
Newton M.
(Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, SK, Canada)
,
Li Y.-Q.
(Robust Chip Inc., Pleasanton, CA, USA)
,
Liu R.
(Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, SK, Canada)
,
Bhuva B. L.
(Vanderbilt University, Nashville, TN, USA)
,
Wen S.-J.
(Cisco Systems, San Jose, CA, USA)
,
Wong R.
(Cisco Systems, San Jose, CA, USA)
,
Fung R.
(Cisco Systems, San Jose, CA, USA)
,
Baeg S.
(Hanyang University, Seoul, South Korea)
,
Massengill L. W.
(Vanderbilt University, Nashville, TN, USA)
資料名:
IEEE Transactions on Nuclear Science
(IEEE Transactions on Nuclear Science)
巻:
64
号:
1
ページ:
367-373
発行年:
2017年
JST資料番号:
C0235A
ISSN:
0018-9499
CODEN:
IETNAE
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)