文献
J-GLOBAL ID:201702224498254706
整理番号:17A0697729
多孔質シリコンの内部および外部表面の選択的特性化のための角度分解XPS【Powered by NICT】
Angle resolved XPS for selective characterization of internal and external surface of porous silicon
著者 (7件):
Lion Anna
(Nanoscience Laboratory, Department of Physics, University of Trento, Via Sommarive 14, 38123 Povo, Trento, Italy)
,
Laidani Nadhira
(Centre for Materials and Microsystems, Bruno Kessler Foundation, Via Sommarive 18, 38123 Povo, Trento, Italy)
,
Bettotti Paolo
(Nanoscience Laboratory, Department of Physics, University of Trento, Via Sommarive 14, 38123 Povo, Trento, Italy)
,
Piotto Chiara
(Nanoscience Laboratory, Department of Physics, University of Trento, Via Sommarive 14, 38123 Povo, Trento, Italy)
,
Pepponi Giancarlo
(Micro Nano Facility, Bruno Kessler Foundation, Via Sommarive 18, 38123 Povo, Trento, Italy)
,
Barozzi Mario
(Micro Nano Facility, Bruno Kessler Foundation, Via Sommarive 18, 38123 Povo, Trento, Italy)
,
Scarpa Marina
(Nanoscience Laboratory, Department of Physics, University of Trento, Via Sommarive 14, 38123 Povo, Trento, Italy)
資料名:
Applied Surface Science
(Applied Surface Science)
巻:
406
ページ:
144-149
発行年:
2017年
JST資料番号:
B0707B
ISSN:
0169-4332
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)