文献
J-GLOBAL ID:201702227858262692
整理番号:17A0697850
ゾル-ゲル誘導した0.65PMN-0.35PT薄膜の構造と電気的性質に及ぼす焼なまし温度の影響【Powered by NICT】
Effects of annealing temperature on structure and electrical properties of sol-gel derived 0.65PMN-0.35PT thin film
著者 (8件):
Zhou Dingguo
(School of Materials Science and Engineering, Wuhan University of Technology, Wuhan 430070, People’s Republic of China)
,
Sun Huajun
(School of Materials Science and Engineering, Wuhan University of Technology, Wuhan 430070, People’s Republic of China)
,
Sun Huajun
(Advanced Ceramics Institute of Zibo New & High-Tech Industrial Development Zone, Zibo 255000, People’s Republic of China)
,
Liu Xiaofang
(School of Chemistry, Chemical Engineering and Life Sciences, Wuhan University of Technology, Wuhan 430070, People’s Republic of China)
,
Sui Huiting
(Advanced Ceramics Institute of Zibo New & High-Tech Industrial Development Zone, Zibo 255000, People’s Republic of China)
,
Guo Qinghu
(School of Materials Science and Engineering, Wuhan University of Technology, Wuhan 430070, People’s Republic of China)
,
Liu Pengdong
(School of Materials Science and Engineering, Wuhan University of Technology, Wuhan 430070, People’s Republic of China)
,
Ruan Yong
(Collaborative Innovation Center for Micro/Nano Fabrication, Device and System, State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, 100084, People’s Republic of China)
資料名:
Ceramics International
(Ceramics International)
巻:
43
号:
8
ページ:
5901-5906
発行年:
2017年
JST資料番号:
H0705A
ISSN:
0272-8842
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)