文献
J-GLOBAL ID:201702228047811471
整理番号:17A0401872
わずかに軸外反射点回折干渉計を用いた干渉位相差顕微鏡法【Powered by NICT】
Interferometric phase microscopy using slightly-off-axis reflective point diffraction interferometer
著者 (6件):
Bai Hongyi
(College of Information and Communication Engineering, Harbin Engineering University, Harbin, Heilongjiang 150001, PR China)
,
Zhong Zhi
(College of Information and Communication Engineering, Harbin Engineering University, Harbin, Heilongjiang 150001, PR China)
,
Shan Mingguang
(College of Information and Communication Engineering, Harbin Engineering University, Harbin, Heilongjiang 150001, PR China)
,
Liu Lei
(College of Information and Communication Engineering, Harbin Engineering University, Harbin, Heilongjiang 150001, PR China)
,
Guo Lili
(College of Information and Communication Engineering, Harbin Engineering University, Harbin, Heilongjiang 150001, PR China)
,
Zhang Yabin
(College of Information and Communication Engineering, Harbin Engineering University, Harbin, Heilongjiang 150001, PR China)
資料名:
Optics and Lasers in Engineering
(Optics and Lasers in Engineering)
巻:
90
ページ:
155-160
発行年:
2017年
JST資料番号:
A0602B
ISSN:
0143-8166
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)