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J-GLOBAL ID:201702228065046256
整理番号:17A1777964
低温陽子照射後のpチャネルCCDにおける欠陥の発生と影響【Powered by NICT】
Evolution and Impact of Defects in a p-Channel CCD After Cryogenic Proton-Irradiation
著者 (7件):
Wood Daniel
(Department of Physical Sciences, Center for Electronic Imaging, The Open University, Milton Keynes, U.K.)
,
Hall David J.
(Department of Physical Sciences, Center for Electronic Imaging, The Open University, Milton Keynes, U.K.)
,
Gow Jason
(Department of Physical Sciences, Center for Electronic Imaging, The Open University, Milton Keynes, U.K.)
,
Skottfelt Jesper
(Department of Physical Sciences, Center for Electronic Imaging, The Open University, Milton Keynes, U.K.)
,
Murray Neil J.
(Dynamic Imaging Analytics, Bletchley Park, Milton Keynes, U.K.)
,
Stefanov Konstantin
(Department of Physical Sciences, Center for Electronic Imaging, The Open University, Milton Keynes, U.K.)
,
Holland Andrew D.
(Department of Physical Sciences, Center for Electronic Imaging, The Open University, Milton Keynes, U.K.)
資料名:
IEEE Transactions on Nuclear Science
(IEEE Transactions on Nuclear Science)
巻:
64
号:
11
ページ:
2814-2821
発行年:
2017年
JST資料番号:
C0235A
ISSN:
0018-9499
CODEN:
IETNAE
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)