文献
J-GLOBAL ID:201702228132177031
整理番号:17A0400508
高温で動作するESD保護素子の特性【Powered by NICT】
Characteristics of ESD protection devices operated under elevated temperatures
著者 (7件):
Liang Wei
(Department of Electrical Engineering and Computer Science, University of Central Florida, Orlando, FL, USA)
,
Dong Aihua
(Department of Electrical Engineering and Computer Science, University of Central Florida, Orlando, FL, USA)
,
Li Hang
(Department of Electrical Engineering and Computer Science, University of Central Florida, Orlando, FL, USA)
,
Miao Meng
(Department of Electrical Engineering and Computer Science, University of Central Florida, Orlando, FL, USA)
,
Kuo Chung-Chen
(Allegro MicroSystem LLC, Worcester, MA, USA)
,
Klebanov Maxim
(Allegro MicroSystem LLC, Worcester, MA, USA)
,
Liou Juin J.
(Department of Electrical Engineering and Computer Science, University of Central Florida, Orlando, FL, USA)
資料名:
Microelectronics Reliability
(Microelectronics Reliability)
巻:
66
ページ:
46-51
発行年:
2016年
JST資料番号:
C0530A
ISSN:
0026-2714
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)