文献
J-GLOBAL ID:201702228230613169
整理番号:17A0644073
多結晶ZnO薄膜における深準位の欠陥についての研究
Investigation on deep level defects in polycrystalline ZnO thin films
著者 (4件):
Tsiarapas Christos
(Department of Electrical and Computer Engineering, Democritus University of Thrace, Building A’ E&CE, University Campus Xanthi-Kimmeria, 67100 Xanthi, Greece)
,
Girginoudi Dimitra
(Department of Electrical and Computer Engineering, Democritus University of Thrace, Building A’ E&CE, University Campus Xanthi-Kimmeria, 67100 Xanthi, Greece)
,
Dimitriadis Evangelos Ioannou
(Informatics Engineering Department, Technological Educational Institution of Central Macedonia, Terma Magnisias, 62124 Serres, Greece)
,
Georgoulas Nikolaos
(Department of Electrical and Computer Engineering, Democritus University of Thrace, Building A’ E&CE, University Campus Xanthi-Kimmeria, 67100 Xanthi, Greece)
資料名:
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
(Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena)
巻:
35
号:
3
ページ:
031203-031203-6
発行年:
2017年05月
JST資料番号:
E0974A
ISSN:
2166-2746
CODEN:
JVTBD9
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)