文献
J-GLOBAL ID:201702228308036323
整理番号:17A1555400
有限要素法を用いた繰り返し軸引張荷重下での伸縮性相互接続の疲労寿命に及ぼすカプセル封じの効果【Powered by NICT】
The effects of encapsulation on fatigue lifetime of stretchable interconnects under uniaxial cyclic tensile loading by finite element methods
著者 (5件):
Li Tingting
(School of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, China)
,
Pan Kailin
(School of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, China)
,
Wang Wenjia
(School of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, China)
,
Han Xufeng
(School of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, China)
,
Cao Weiwu
(School of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
ICEPT
ページ:
1557-1560
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)