文献
J-GLOBAL ID:201702228309674918
整理番号:17A1498835
多重分散関数の組合せを用いたGe_30 xSb_x Se_70膜の分光学的偏光解析法による評価【Powered by NICT】
Spectroscopic ellipsometry characterization of Ge30-xSbx Se70 films using combinations of multiple dispersion functions
著者 (8件):
Abdel-Wahab F.
(Department of Physics, Faculty of Science, University of Taif, Al Taif, Saudi Arabia)
,
Abdel-Wahab F.
(Department of Physics, Faculty of Science, University of Aswan, Aswan, Egypt)
,
Badawi A.
(Department of Physics, Faculty of Science, University of Taif, Al Taif, Saudi Arabia)
,
Alatibi M.S.
(Department of Physics, Faculty of Science, University of Taif, Al Taif, Saudi Arabia)
,
Alomairy S.E.
(Department of Physics, Faculty of Science, University of Taif, Al Taif, Saudi Arabia)
,
Ali karar N.N.
(Department of Physics, Faculty of Science, University of Aswan, Aswan, Egypt)
,
Ashraf I.M.
(Department of Physics, Faculty of Science, University of Aswan, Aswan, Egypt)
,
Ahmed E.M.
(Department of Physics, Faculty of Science, University of Damietta, Damietta, Egypt)
資料名:
Optik
(Optik)
巻:
147
ページ:
59-71
発行年:
2017年
JST資料番号:
D0251A
ISSN:
0030-4026
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)