文献
J-GLOBAL ID:201702229362961033
整理番号:17A0402800
半絶縁性GaAsへのMgおよびPt接触の比較研究:電気的およびXPSによるキャラクタリゼーション【Powered by NICT】
A comparative study of Mg and Pt contacts on semi-insulating GaAs: Electrical and XPS characterization
著者 (10件):
Dubecky F.
(Institute of Electrical Engineering, SAS, Dubravska cesta 9, Bratislava, SK-84104, Slovakia)
,
Kindl D.
(Institute of Physics CAS, v.v.i., Cukrovarnicka 10, CZ-16200 Prague, Czech Republic)
,
Hubik P.
(Institute of Physics CAS, v.v.i., Cukrovarnicka 10, CZ-16200 Prague, Czech Republic)
,
Micusik M.
(Polymer Institute, SAS, Dubravska cesta 9, Bratislava, SK-84541, Slovakia)
,
Dubecky M.
(Department of Physics, Faculty of Science, University of Ostrava, 30. dubna 22, CZ-70103 Ostrava 1, Czech Republic)
,
Bohacek P.
(Institute of Electrical Engineering, SAS, Dubravska cesta 9, Bratislava, SK-84104, Slovakia)
,
Vanko G.
(Institute of Electrical Engineering, SAS, Dubravska cesta 9, Bratislava, SK-84104, Slovakia)
,
Gombia E.
(IMEM-CNR, Parco area delle Scienze 37/A, Parma, I-43010, Italy)
,
Necas V.
(Faculty of Electrical Engineering and Information Technology, SUT, Ilkovicova 3, Bratislava, SK-81219, Slovakia)
,
Mudron J.
(Department of Electronics, Academy of Armed Forces, Demaenova 393, Liptovsky Mikulas, SK-03106, Slovakia)
資料名:
Applied Surface Science
(Applied Surface Science)
巻:
395
ページ:
131-135
発行年:
2017年
JST資料番号:
B0707B
ISSN:
0169-4332
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)