文献
J-GLOBAL ID:201702230168285835
整理番号:17A0055493
片持梁と膜に位置するAlGaN/GaN高電子移動度トランジスタの歪誘起応答【Powered by NICT】
Strain induced response of AlGaN/GaN high electron mobility transistor located on cantilever and membrane
著者 (8件):
Dzuba J.
(Institute of Electrical Engineering, Slovak Academy of Sciences, Du ́bravska ́ cesta 9, 841 04 Bratislava, Slovakia)
,
Vanko G.
(Institute of Electrical Engineering, Slovak Academy of Sciences, Du ́bravska ́ cesta 9, 841 04 Bratislava, Slovakia)
,
Babchenko O.
(Institute of Electrical Engineering, Slovak Academy of Sciences, Du ́bravska ́ cesta 9, 841 04 Bratislava, Slovakia)
,
Lalinsky T.
(Institute of Electrical Engineering, Slovak Academy of Sciences, Du ́bravska ́ cesta 9, 841 04 Bratislava, Slovakia)
,
Horvat F.
(Institute of Applied Mechanics and Mechatronics, Faculty of Mechanical Engineering, Slovak University of Technology in Bratislava, Na ́m. Slobody 17, 812 31 Bratislava, Slovakia)
,
Szarvas M.
(Institute of Applied Mechanics and Mechatronics, Faculty of Mechanical Engineering, Slovak University of Technology in Bratislava, Na ́m. Slobody 17, 812 31 Bratislava, Slovakia)
,
Kovac T.
(Institute of Applied Mechanics and Mechatronics, Faculty of Mechanical Engineering, Slovak University of Technology in Bratislava, Na ́m. Slobody 17, 812 31 Bratislava, Slovakia)
,
Hucko B.
(Institute of Applied Mechanics and Mechatronics, Faculty of Mechanical Engineering, Slovak University of Technology in Bratislava, Na ́m. Slobody 17, 812 31 Bratislava, Slovakia)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
ASDAM
ページ:
227-230
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)