文献
J-GLOBAL ID:201702231403388750
整理番号:17A0362454
[110]配向けい素ナノワイヤの機械的応答に及ぼすりんの影響の数値的研究【Powered by NICT】
Numerical investigation of the effects of phosphorus on the mechanical responses of [1 1 0]-oriented silicon nano-wires
著者 (6件):
Liu B.
(Science and Technology on Integrated Logistics Support Laboratory, National University of Defense Technology, Changsha, China)
,
Tao J.Y.
(Science and Technology on Integrated Logistics Support Laboratory, National University of Defense Technology, Changsha, China)
,
Chen X.
(Science and Technology on Integrated Logistics Support Laboratory, National University of Defense Technology, Changsha, China)
,
Zhang Y.A.
(Science and Technology on Integrated Logistics Support Laboratory, National University of Defense Technology, Changsha, China)
,
Jiang Yu
(Science and Technology on Integrated Logistics Support Laboratory, National University of Defense Technology, Changsha, China)
,
Qian Y.
(Mianyang High-tech Experimental Middle School, Mianyang, China)
資料名:
Microelectronics Reliability
(Microelectronics Reliability)
巻:
64
ページ:
225-229
発行年:
2016年
JST資料番号:
C0530A
ISSN:
0026-2714
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)