文献
J-GLOBAL ID:201702231725057445
整理番号:17A0374456
圧電応答力顕微鏡(PFM)法により研究した銅ドープ酸化亜鉛(ZnO:Cu)薄膜における偏光回転【Powered by NICT】
Polarization rotation in copper doped zinc oxide (ZnO:Cu) thin films studied by Piezoresponse Force Microscopy (PFM) techniques
著者 (4件):
Xiao Juanxiu
(Department of Mechanical Engineering, National University of Singapore, 9, Engineering Drive 1, 117576, Singapore)
,
Herng Tun Seng
(Department of Materials Science and Engineering, National University of Singapore, 9, Engineering Drive 1, 117576, Singapore)
,
Ding Jun
(Department of Materials Science and Engineering, National University of Singapore, 9, Engineering Drive 1, 117576, Singapore)
,
Zeng Kaiyang
(Department of Mechanical Engineering, National University of Singapore, 9, Engineering Drive 1, 117576, Singapore)
資料名:
Acta Materialia
(Acta Materialia)
巻:
123
ページ:
394-403
発行年:
2017年
JST資料番号:
A0316A
ISSN:
1359-6454
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)