文献
J-GLOBAL ID:201702232497989111
整理番号:17A0400537
磁気抵抗ランダムアクセスメモリにおける全電離線量誘起読取ビット誤差の研究【Powered by NICT】
Study of total ionizing dose induced read bit errors in magneto-resistive random access memory
著者 (13件):
Zhang Haohao
(The Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China)
,
Zhang Haohao
(Jiangsu Synergetic Innovation Center for Advanced Materials (SICAM), Nanjing 210009, China)
,
Bi Jinshun
(The Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China)
,
Bi Jinshun
(Jiangsu Synergetic Innovation Center for Advanced Materials (SICAM), Nanjing 210009, China)
,
Wang Haibin
(School of Internet of Things Engineering, HoHai University, Changzhou, China)
,
Hu Hongyang
(The Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China)
,
Hu Hongyang
(Jiangsu Synergetic Innovation Center for Advanced Materials (SICAM), Nanjing 210009, China)
,
Li Jin
(The Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China)
,
Li Jin
(Jiangsu Synergetic Innovation Center for Advanced Materials (SICAM), Nanjing 210009, China)
,
Ji Lanlong
(The Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China)
,
Ji Lanlong
(Jiangsu Synergetic Innovation Center for Advanced Materials (SICAM), Nanjing 210009, China)
,
Liu Ming
(The Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China)
,
Liu Ming
(Jiangsu Synergetic Innovation Center for Advanced Materials (SICAM), Nanjing 210009, China)
資料名:
Microelectronics Reliability
(Microelectronics Reliability)
巻:
67
ページ:
104-110
発行年:
2016年
JST資料番号:
C0530A
ISSN:
0026-2714
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)