文献
J-GLOBAL ID:201702232546483215
整理番号:17A0470083
新しい電池劣化モデルを用いたLi(NiMnCo)O_2~をベースにしたリチウムイオン電池の予知【Powered by NICT】
Prognostics of Li(NiMnCo)O2-based lithium-ion batteries using a novel battery degradation model
著者 (4件):
Yang Fangfang
(Department of Systems Engineering and Engineering Management, City University of Hong Kong, Tat Chee Avenue, Kowloon, Hong Kong, China)
,
Wang Dong
(Department of Systems Engineering and Engineering Management, City University of Hong Kong, Tat Chee Avenue, Kowloon, Hong Kong, China)
,
Xing Yinjiao
(Center for Advanced Life Cycle Engineering, University of Maryland, College Park, MD 20742, USA)
,
Tsui Kwok-Leung
(Department of Systems Engineering and Engineering Management, City University of Hong Kong, Tat Chee Avenue, Kowloon, Hong Kong, China)
資料名:
Microelectronics Reliability
(Microelectronics Reliability)
巻:
70
ページ:
70-78
発行年:
2017年
JST資料番号:
C0530A
ISSN:
0026-2714
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)