文献
J-GLOBAL ID:201702232556394187
整理番号:17A0171949
電子論に基づく電気めっき薄膜の内部応力解析【JST・京大機械翻訳】
Internal stress analysis of electroplated films based on electron theory
著者 (7件):
Ren Fengzhang
(School of Materials Science and Engineering, Henan University of Science and Technology)
,
Yin Litao
(School of Materials Science and Engineering, Henan University of Science and Technology)
,
Wang Shanshan
(School of Materials Science and Engineering, Henan University of Science and Technology)
,
Xiong Yi
(School of Materials Science and Engineering, Henan University of Science and Technology)
,
Volinsky A A
(Department of Mechanical Engineering, University of South Florida)
,
Tian Baohong
(School of Materials Science and Engineering, Henan University of Science and Technology)
,
Wei Shizhong
(School of Materials Science and Engineering, Henan University of Science and Technology)
資料名:
Transactions of Nonferrous Metals Society of China
(Transactions of Nonferrous Metals Society of China)
巻:
26
号:
9
ページ:
2413-2418
発行年:
2016年
JST資料番号:
W0396A
ISSN:
1003-6326
CODEN:
TNMCEW
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
中国 (CHN)
言語:
英語 (EN)