文献
J-GLOBAL ID:201702233321171002
整理番号:17A0311850
微細構造,WドープNa_0 5Bi_0 5TiO_3薄膜の強誘電及び誘電特性に及ぼすアニーリング温度の影響【Powered by NICT】
Effects of annealing temperature on the microstructure, ferroelectric and dielectric properties of W-doped Na0.5Bi0.5TiO3 thin films
著者 (8件):
Jiang X.M.
(School of Materials Science and Engineering, University of Jinan, Jinan 250022, China)
,
Yang C.H.
(School of Materials Science and Engineering, University of Jinan, Jinan 250022, China)
,
Yang C.H.
(Shandong Provincial Key Laboratory of Preparation and Measurement of Building Materials, University of Jinan, Jinan 250022, China)
,
Lv P.P.
(School of Materials Science and Engineering, University of Jinan, Jinan 250022, China)
,
Guo S.J.
(School of Materials Science and Engineering, University of Jinan, Jinan 250022, China)
,
Feng C.
(School of Materials Science and Engineering, University of Jinan, Jinan 250022, China)
,
Geng F.J.
(School of Materials Science and Engineering, University of Jinan, Jinan 250022, China)
,
Hu G.D.
(School of Materials Science and Engineering, University of Jinan, Jinan 250022, China)
資料名:
Ceramics International
(Ceramics International)
巻:
42
号:
10
ページ:
12210-12214
発行年:
2016年08月
JST資料番号:
H0705A
ISSN:
0272-8842
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)