文献
J-GLOBAL ID:201702234936422602
整理番号:17A0379147
時変分解速度下での逆Gauss過程モデルを用いたBayes劣化解析【Powered by NICT】
Bayesian Degradation Analysis With Inverse Gaussian Process Models Under Time-Varying Degradation Rates
著者 (5件):
Peng Weiwen
(Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, China)
,
Li Yan-Feng
(Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, China)
,
Yang Yuan-Jian
(Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, China)
,
Mi Jinhua
(Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, China)
,
Huang Hong-Zhong
(Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, China)
資料名:
IEEE Transactions on Reliability
(IEEE Transactions on Reliability)
巻:
66
号:
1
ページ:
84-96
発行年:
2017年
JST資料番号:
C0448A
ISSN:
0018-9529
CODEN:
IERQAD
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)