文献
J-GLOBAL ID:201702235485417249
整理番号:17A0214170
高収率大面積MoS_2技術:材料,デバイスと回路の同時最適化【Powered by NICT】
High-yield large area MoS2 technology: Material, device and circuits co-optimization
著者 (13件):
Yu L.
(Massachusetts Institute of Technology, Cambridge, MA, USA)
,
El-Damak D.
(Massachusetts Institute of Technology, Cambridge, MA, USA)
,
Radhakrishna U.
(Massachusetts Institute of Technology, Cambridge, MA, USA)
,
Zubair A.
(Massachusetts Institute of Technology, Cambridge, MA, USA)
,
Piedra D.
(Massachusetts Institute of Technology, Cambridge, MA, USA)
,
Ling X.
(Massachusetts Institute of Technology, Cambridge, MA, USA)
,
Lin Y.
(Massachusetts Institute of Technology, Cambridge, MA, USA)
,
Zhang Y.
(Massachusetts Institute of Technology, Cambridge, MA, USA)
,
Lee Y.-H.
(National Tsing-Hua University, Hsinchu, Taiwan)
,
Antoniadis D.
(Massachusetts Institute of Technology, Cambridge, MA, USA)
,
Kong J.
(Massachusetts Institute of Technology, Cambridge, MA, USA)
,
Chandrakasan A.
(Massachusetts Institute of Technology, Cambridge, MA, USA)
,
Palacios T.
(Massachusetts Institute of Technology, Cambridge, MA, USA)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
IEDM
ページ:
5.7.1-5.7.4
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)