文献
J-GLOBAL ID:201702235748143091
整理番号:17A0329327
CNT TFETのゲート誘電体強度に依存する性能:タイトバインディング研究【Powered by NICT】
Gate dielectric strength dependent performance of CNT TFET: A tight binding study
著者 (4件):
Sarker Md. Shamim
(Department of Electrical and Electronic Engineering, Khulna University of Engineering & Technology, Khulna-9203, Bangladesh)
,
Islam Muhammad Mainul
(Department of Electrical and Electronic Engineering, Khulna University of Engineering & Technology, Khulna-9203, Bangladesh)
,
Alam Md. Nur Kutubul
(Department of Electrical and Electronic Engineering, Khulna University of Engineering & Technology, Khulna-9203, Bangladesh)
,
Islam Md. Rafiqul
(Department of Electrical and Electronic Engineering, Khulna University of Engineering & Technology, Khulna-9203, Bangladesh)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
ICCIT
ページ:
159-163
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)