文献
J-GLOBAL ID:201702235778609915
整理番号:17A1639028
多重溝を用いた高速回復SOI PiNダイオード【Powered by NICT】
Fast recovery SOI PiN diode with multiple trenches
著者 (6件):
Zhang Long
(National ASIC System Engineering Research Center, Southeast University, 210096, Nanjing, Jiangsu, China)
,
Zhu Jing
(National ASIC System Engineering Research Center, Southeast University, 210096, Nanjing, Jiangsu, China)
,
Zhao Minna
(National ASIC System Engineering Research Center, Southeast University, 210096, Nanjing, Jiangsu, China)
,
Ding Desheng
(National ASIC System Engineering Research Center, Southeast University, 210096, Nanjing, Jiangsu, China)
,
Chen Jian
(National ASIC System Engineering Research Center, Southeast University, 210096, Nanjing, Jiangsu, China)
,
Sun Weifeng
(National ASIC System Engineering Research Center, Southeast University, 210096, Nanjing, Jiangsu, China)
資料名:
Superlattices and Microstructures
(Superlattices and Microstructures)
巻:
111
ページ:
405-413
発行年:
2017年
JST資料番号:
D0600B
ISSN:
0749-6036
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)