文献
J-GLOBAL ID:201702237461924154
整理番号:17A0685003
直交Haidinger干渉縞の位相解析を用いた2π曖昧性のない平行ガラス板の厚み測定用の干渉測定システム
An interferometric system for measuring thickness of parallel glass plates without 2π ambiguity using phase analysis of quadrature Haidinger fringes
著者 (5件):
Kim Jong-Ahn
(Center for Length, Division of Physical Metrology, Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-gu 305-340, South Korea)
,
Kim Jae Wan
(Center for Length, Division of Physical Metrology, Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-gu 305-340, South Korea)
,
Kang Chu-Shik
(Center for Length, Division of Physical Metrology, Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-gu 305-340, South Korea)
,
Jin Jonghan
(Center for Length, Division of Physical Metrology, Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-gu 305-340, South Korea)
,
Lee Jae Yong
(Center for Length, Division of Physical Metrology, Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-gu 305-340, South Korea)
資料名:
Review of Scientific Instruments
(Review of Scientific Instruments)
巻:
88
号:
5
ページ:
055108-055108-7
発行年:
2017年05月
JST資料番号:
D0517A
ISSN:
0034-6748
CODEN:
RSINAK
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)