文献
J-GLOBAL ID:201702238000903216
整理番号:17A0998044
精密ろ過と限外ろ過への応用のためのコロイドナノ粒子の濃度測定法の評価:誘導プラズマ-質量分析,ナノ粒子追跡分析及びエレクトロスプレイ走査移動度粒径測定器【Powered by NICT】
Evaluation of concentration measurement techniques of colloidal nanoparticles for microfiltration and ultrafiltration applications: Inductively coupled plasma-mass spectrometry, nanoparticle tracking analysis and electrospray-scanning mobility particle sizer
著者 (6件):
Lee Handol
(Particle Technology Laboratory, Mechanical Engineering, University of Minnesota, 111 Church St., S.E., Minneapolis 55455, USA)
,
Chen Sheng-Chieh
(Particle Technology Laboratory, Mechanical Engineering, University of Minnesota, 111 Church St., S.E., Minneapolis 55455, USA)
,
Kim Changhyuk
(Particle Technology Laboratory, Mechanical Engineering, University of Minnesota, 111 Church St., S.E., Minneapolis 55455, USA)
,
Westenburg Ellen
(Entegris Inc., 101 Peavey Road, Chaska, Minneapolis 55318, USA)
,
Moon Sung In
(Entegris Inc., 101 Peavey Road, Chaska, Minneapolis 55318, USA)
,
Pui David Y.H.
(Particle Technology Laboratory, Mechanical Engineering, University of Minnesota, 111 Church St., S.E., Minneapolis 55455, USA)
資料名:
Separation and Purification Technology
(Separation and Purification Technology)
巻:
184
ページ:
34-42
発行年:
2017年
JST資料番号:
T0428B
ISSN:
1383-5866
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)