文献
J-GLOBAL ID:201702238262668307
整理番号:17A1569173
カートリッジ症例表面欠陥のための高速検査システム【Powered by NICT】
High-speed inspection system for surface defect on cartridge case
著者 (7件):
Zhang Jing
(School of Optoelectronic Information of University of Electronic Science and Technology of China, Chengdu, China)
,
Zhong Ya
(School of Optoelectronic Information of University of Electronic Science and Technology of China, Chengdu, China)
,
Du Xiaohui
(School of Optoelectronic Information of University of Electronic Science and Technology of China, Chengdu, China)
,
Ni Guangming
(School of Optoelectronic Information of University of Electronic Science and Technology of China, Chengdu, China)
,
Liu Juanxiu
(School of Optoelectronic Information of University of Electronic Science and Technology of China, Chengdu, China)
,
Liu Lin
(School of Optoelectronic Information of University of Electronic Science and Technology of China, Chengdu, China)
,
Liu Yong
(School of Optoelectronic Information of University of Electronic Science and Technology of China, Chengdu, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
IAEAC
ページ:
1340-1344
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)