文献
J-GLOBAL ID:201702238950329068
整理番号:17A1186008
高速TEM歪作用実験のためのフェムト秒レーザ加工とイオンミリングによるTEM試料調製【Powered by NICT】
TEM sample preparation by femtosecond laser machining and ion milling for high-rate TEM straining experiments
著者 (7件):
Voisin Thomas
(Dept. of Materials Science and Engineering, Johns Hopkins University, Baltimore, MD 21218, USA)
,
Grapes Michael D.
(Dept. of Materials Science and Engineering, Johns Hopkins University, Baltimore, MD 21218, USA)
,
Zhang Yong
(Dept. of Mechanical Engineering, Johns Hopkins University, Baltimore, MD 21218, USA)
,
Lorenzo Nicholas
(US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, MD 21005, USA)
,
Ligda Jonathan
(US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, MD 21005, USA)
,
Schuster Brian
(US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, MD 21005, USA)
,
Weihs Timothy P.
(Dept. of Materials Science and Engineering, Johns Hopkins University, Baltimore, MD 21218, USA)
資料名:
Ultramicroscopy
(Ultramicroscopy)
巻:
175
ページ:
1-8
発行年:
2017年
JST資料番号:
W0972A
ISSN:
0304-3991
CODEN:
ULTRD
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)