文献
J-GLOBAL ID:201702239176873202
整理番号:17A0362451
加速時効中のEFTバーストに対するマイクロコントローラ感受性変化【Powered by NICT】
Microcontroller susceptibility variations to EFT burst during accelerated aging
著者 (7件):
Wu J.
(College of Electronic and Engineering, National University of Defense Technology, Changsha, China)
,
Wu J.
(Tianjin Binhai Civil-military Integrated Innovation Institute, Tianjin, China)
,
Li C.
(College of Electronic and Engineering, National University of Defense Technology, Changsha, China)
,
Li B.
(Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China)
,
Li B.
(Key Laboratory of Silicon Device and Technology, Beijing, China)
,
Zhu W.
(Tianjin Binhai Civil-military Integrated Innovation Institute, Tianjin, China)
,
Wang H.
(College of Electronic and Engineering, National University of Defense Technology, Changsha, China)
資料名:
Microelectronics Reliability
(Microelectronics Reliability)
巻:
64
ページ:
210-214
発行年:
2016年
JST資料番号:
C0530A
ISSN:
0026-2714
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)