文献
J-GLOBAL ID:201702241536178108
整理番号:17A1550647
HVE SnS光吸収材膜上の真空および窒素アニーリングの影響【Powered by NICT】
Impact of vacuum and nitrogen annealing on HVE SnS photoabsorber films
著者 (8件):
Naidu Revathi
(Department of Materials and Environmental Technology, Tallinn University of Technology, Ehitajate tee 5, Tallinn 19086, Estonia)
,
Loorits Mihkel
(Department of Materials and Environmental Technology, Tallinn University of Technology, Ehitajate tee 5, Tallinn 19086, Estonia)
,
Kaerber Erki
(Department of Materials and Environmental Technology, Tallinn University of Technology, Ehitajate tee 5, Tallinn 19086, Estonia)
,
Volobujeva Olga
(Department of Materials and Environmental Technology, Tallinn University of Technology, Ehitajate tee 5, Tallinn 19086, Estonia)
,
Raudoja Jaan
(Department of Materials and Environmental Technology, Tallinn University of Technology, Ehitajate tee 5, Tallinn 19086, Estonia)
,
Maticiuc Natalia
(Department of Materials and Environmental Technology, Tallinn University of Technology, Ehitajate tee 5, Tallinn 19086, Estonia)
,
Bereznev Sergei
(Department of Materials and Environmental Technology, Tallinn University of Technology, Ehitajate tee 5, Tallinn 19086, Estonia)
,
Mellikov Enn
(Department of Materials and Environmental Technology, Tallinn University of Technology, Ehitajate tee 5, Tallinn 19086, Estonia)
資料名:
Materials Science in Semiconductor Processing
(Materials Science in Semiconductor Processing)
巻:
71
ページ:
252-257
発行年:
2017年
JST資料番号:
W1055A
ISSN:
1369-8001
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)