文献
J-GLOBAL ID:201702241627255414
整理番号:17A0668092
semicon結合XLPE絶縁の電気特性に及ぼす温度と電場の影響【Powered by NICT】
The impacts of the temperature and electric field on the electrical characteristics in semicon-bonded XLPE insulation
著者 (6件):
Hao M.
(Tony Davis High Voltage Laboratory, University of Southampton, Southampton, SOl7 lBJ, UK)
,
Fazal A.
(Tony Davis High Voltage Laboratory, University of Southampton, Southampton, SOl7 lBJ, UK)
,
Chen G.
(Tony Davis High Voltage Laboratory, University of Southampton, Southampton, SOl7 lBJ, UK)
,
Vaughan A. S.
(Tony Davis High Voltage Laboratory, University of Southampton, Southampton, SOl7 lBJ, UK)
,
Cao J.
(Smart Grid Research Institute, Beijing, China)
,
Wang H.
(Smart Grid Research Institute, Beijing, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
ICHVE
ページ:
1-4
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)