文献
J-GLOBAL ID:201702241640965168
整理番号:17A0362434
非Gaussランダム振動励起下での電子部品の加速試験のための疲労寿命予測モデル【Powered by NICT】
Fatigue life prediction model for accelerated testing of electronic components under non-Gaussian random vibration excitations
著者 (4件):
Jiang Yu
(Science and Technology on Integrated Logistics Support Laboratory, College of Mechatronic Engineering and Automation, National University of Defense Technology, Changsha, China)
,
Tao J.Y.
(Science and Technology on Integrated Logistics Support Laboratory, College of Mechatronic Engineering and Automation, National University of Defense Technology, Changsha, China)
,
Zhang Y.A.
(Science and Technology on Integrated Logistics Support Laboratory, College of Mechatronic Engineering and Automation, National University of Defense Technology, Changsha, China)
,
Yun G.J.
(Department of Mechanical and Aerospace Engineering, Seoul National University, Seoul, South Korea)
資料名:
Microelectronics Reliability
(Microelectronics Reliability)
巻:
64
ページ:
120-124
発行年:
2016年
JST資料番号:
C0530A
ISSN:
0026-2714
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)