文献
J-GLOBAL ID:201702241986660388
整理番号:17A1637445
注入欠陥により誘起された素子故障の事例研究【Powered by NICT】
Case study of device failure induced by implantation defect
著者 (3件):
Guo Ming
(Product Analysis Engineer of Quality Department in NXP Semiconductors (China) Limited., No.15 Xinghua Avenue, Xiqing Economic Development Area, Tianjin, 300385, China)
,
Che Yi
(Product Analysis Engineer of Quality Department in NXP Semiconductors (China) Limited., No.15 Xinghua Avenue, Xiqing Economic Development Area, Tianjin, 300385, China)
,
Li Jinglong
(Product Analysis Engineer of Quality Department in NXP Semiconductors (China) Limited., No.15 Xinghua Avenue, Xiqing Economic Development Area, Tianjin, 300385, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
IPFA
ページ:
1-4
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)