文献
J-GLOBAL ID:201702242464307112
整理番号:17A0145906
アナログ回路の故障診断におけるDE ELMの応用【Powered by NICT】
Application of DE-ELM in analog circuit fault diagnosis
著者 (5件):
Zhang Lihua
(Science and Technology on Avionics Integration Laboratory, China National Aeronautical Radio Electronics Research Institute, Shanghai, PR China)
,
Qin Qi
(School of Electronics and Information, Northwestern Polytechnical University, Xi’an, PR China)
,
Shang Yue
(School of Electronics and Information, Northwestern Polytechnical University, Xi’an, PR China)
,
Chen Shaowei
(School of Electronics and Information, Northwestern Polytechnical University, Xi’an, PR China)
,
Zhao Shuai
(School of Electronics and Information, Northwestern Polytechnical University, Xi’an, PR China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
PHM (Chengdu)
ページ:
1-6
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)