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J-GLOBAL ID:201702242727574684   整理番号:17A0795080

その場蒸着前プラズマ窒化とLPCVD-Si3N4ゲート絶縁体を有する超低V_thヒステリシスと電流コラプスのAlGaN/GaN MIS-HEMT【Powered by NICT】

AlGaN/GaN MIS-HEMTs of Very-Low ${V}_{¥sf {{th}}}$ Hysteresis and Current Collapse With In-Situ Pre-Deposition Plasma Nitridation and LPCVD-Si3N4 Gate Insulator
著者 (17件):
Zhang Zhili
(Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-bionics, Chinese Academy of Sciences, Suzhou, China)
Li Weiyi
(Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-bionics, Chinese Academy of Sciences, Suzhou, China)
Fu Kai
(Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-bionics, Chinese Academy of Sciences, Suzhou, China)
Yu Guohao
(Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-bionics, Chinese Academy of Sciences, Suzhou, China)
Zhang Xiaodong
(Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-bionics, Chinese Academy of Sciences, Suzhou, China)
Zhao Yanfei
(Nano-X, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, China)
Sun Shichuang
(Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-bionics, Chinese Academy of Sciences, Suzhou, China)
Song Liang
(Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-bionics, Chinese Academy of Sciences, Suzhou, China)
Deng Xuguang
(Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-bionics, Chinese Academy of Sciences, Suzhou, China)
Xing Zheng
(Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-bionics, Chinese Academy of Sciences, Suzhou, China)
Yang Lei
(Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-bionics, Chinese Academy of Sciences, Suzhou, China)
Ji Rongkun
(Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-bionics, Chinese Academy of Sciences, Suzhou, China)
Zeng Chunhong
(Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-bionics, Chinese Academy of Sciences, Suzhou, China)
Fan Yaming
(Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-bionics, Chinese Academy of Sciences, Suzhou, China)
Dong Zhihua
(School of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China)
Cai Yong
(Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-bionics, Chinese Academy of Sciences, Suzhou, China)
Zhang Bao Shun
(Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-bionics, Chinese Academy of Sciences, Suzhou, China)

資料名:
IEEE Electron Device Letters  (IEEE Electron Device Letters)

巻: 38  号:ページ: 236-239  発行年: 2017年 
JST資料番号: B0344B  ISSN: 0741-3106  CODEN: EDLEDZ  資料種別: 逐次刊行物 (A)
記事区分: 原著論文  発行国: アメリカ合衆国 (USA)  言語: 英語 (EN)
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