文献
J-GLOBAL ID:201702243203352225
整理番号:17A0747955
走査型電子顕微鏡像代表性:ナノ粒子の形態学的データ【Powered by NICT】
Scanning electron microscopy image representativeness: morphological data on nanoparticles
著者 (7件):
ODZIOMEK KATARZYNA
(Laboratory of Environmental Chemometrics, Faculty of Chemistry, University of Gdansk, Gdansk, Poland)
,
ODZIOMEK KATARZYNA
(Computational Research Division, Lawrence Berkeley National Laboratory, Berkeley, California, U.S.A.)
,
USHIZIMA DANIELA
(Computational Research Division, Lawrence Berkeley National Laboratory, Berkeley, California, U.S.A.)
,
OBERBEK PRZEMYSLAW
(Materials Design Division, Faculty of Materials Science and Engineering, Warsaw University of Technology, Warsaw, Poland)
,
KURZYDLOWSKI KRZYSZTOF JAN
(Materials Design Division, Faculty of Materials Science and Engineering, Warsaw University of Technology, Warsaw, Poland)
,
PUZYN TOMASZ
(Laboratory of Environmental Chemometrics, Faculty of Chemistry, University of Gdansk, Gdansk, Poland)
,
HARANCZYK MACIEJ
(Computational Research Division, Lawrence Berkeley National Laboratory, Berkeley, California, U.S.A.)
資料名:
Journal of Microscopy
(Journal of Microscopy)
巻:
265
号:
1
ページ:
34-50
発行年:
2017年
JST資料番号:
B0454B
ISSN:
0022-2720
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)