文献
J-GLOBAL ID:201702244641710295
整理番号:17A0385785
その場環境制御型透過電子顕微鏡での化学抵抗ナノセンサーによる電子ビーム効果の探索
Probing electron beam effects with chemoresistive nanosensors during in situ environmental transmission electron microscopy
著者 (9件):
Steinhauer S.
(Nanoparticles by Design Unit, Okinawa Institute of Science and Technology (OIST) Graduate University, 1919-1 Tancha, Onna-Son, Okinawa 904-0495, Japan)
,
Wang Z.
(State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, China)
,
Zhou Z.
(State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, China)
,
Krainer J.
(Materials Center Leoben Forschung GmbH, 8700 Leoben, Austria)
,
Kock A.
(Materials Center Leoben Forschung GmbH, 8700 Leoben, Austria)
,
Nordlund K.
(Department of Physics and Helsinki Institute of Physics, University of Helsinki, P.O. Box 43, FI-00014 Helsinki, Finland)
,
Djurabekova F.
(Department of Physics and Helsinki Institute of Physics, University of Helsinki, P.O. Box 43, FI-00014 Helsinki, Finland)
,
Grammatikopoulos P.
(Nanoparticles by Design Unit, Okinawa Institute of Science and Technology (OIST) Graduate University, 1919-1 Tancha, Onna-Son, Okinawa 904-0495, Japan)
,
Sowwan M.
(Nanoparticles by Design Unit, Okinawa Institute of Science and Technology (OIST) Graduate University, 1919-1 Tancha, Onna-Son, Okinawa 904-0495, Japan)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
110
号:
9
ページ:
094103-094103-4
発行年:
2017年02月27日
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)