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J-GLOBAL ID:201702245027361708
整理番号:17A0825952
ノーマリオフC 部分的C Oチャネルを達成する2kV絶縁破壊電圧を有するHダイヤモンドMOSFET【Powered by NICT】
Normally-Off C-H Diamond MOSFETs With Partial C-O Channel Achieving 2-kV Breakdown Voltage
著者 (12件):
Kitabayashi Yuya
(Faculty of Science and Engineering, Waseda University, Shinjuku, Tokyo, Japan)
,
Kudo Takuya
(Faculty of Science and Engineering, Waseda University, Shinjuku, Tokyo, Japan)
,
Tsuboi Hidetoshi
(Faculty of Science and Engineering, Waseda University, Shinjuku, Tokyo, Japan)
,
Yamada Tetsuya
(Faculty of Science and Engineering, Waseda University, Shinjuku, Tokyo, Japan)
,
Xu Dechen
(Faculty of Science and Engineering, Waseda University, Shinjuku, Tokyo, Japan)
,
Shibata Masanobu
(Faculty of Science and Engineering, Waseda University, Shinjuku, Tokyo, Japan)
,
Matsumura Daisuke
(Faculty of Science and Engineering, Waseda University, Shinjuku, Tokyo, Japan)
,
Hayashi Yuya
(Faculty of Science and Engineering, Waseda University, Shinjuku, Tokyo, Japan)
,
Syamsul Mohd
(Faculty of Science and Engineering, Waseda University, Shinjuku, Tokyo, Japan)
,
Inaba Masafumi
(Faculty of Science and Engineering, Waseda University, Shinjuku, Tokyo, Japan)
,
Hiraiwa Atsushi
(Institute of Nano-Science and Nano-Engineering, Waseda University, Shinjuku, Tokyo, Japan)
,
Kawarada Hiroshi
(Faculty of Science and Engineering and Institute of Nano-Science and Nano-Engineering, Waseda University, Shinjuku, Tokyo, Japan)
資料名:
IEEE Electron Device Letters
(IEEE Electron Device Letters)
巻:
38
号:
3
ページ:
363-366
発行年:
2017年
JST資料番号:
B0344B
ISSN:
0741-3106
CODEN:
EDLEDZ
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)