文献
J-GLOBAL ID:201702246532086184
整理番号:17A1505801
漏れゲートモデル:脊髄のとう痛とかゆみの強度依存符号化【Powered by NICT】
Leaky Gate Model: Intensity-Dependent Coding of Pain and Itch in the Spinal Cord
著者 (7件):
Sun Shuohao
(The Solomon H. Snyder Department of Neuroscience and Center for Sensory Biology, Johns Hopkins University School of Medicine, Baltimore, MD 21205, USA)
,
Xu Qian
(The Solomon H. Snyder Department of Neuroscience and Center for Sensory Biology, Johns Hopkins University School of Medicine, Baltimore, MD 21205, USA)
,
Guo Changxiong
(Department of Anesthesiology and the Center for the Study of Itch, Department of Ophthalmology and Visual Sciences, Washington University School of Medicine, St Louis, MO, 63110, USA)
,
Guan Yun
(Department of Anesthesiology and Critical Care Medicine, Johns Hopkins University School of Medicine, Baltimore, MD 21205, USA)
,
Liu Qin
(Department of Anesthesiology and the Center for the Study of Itch, Department of Ophthalmology and Visual Sciences, Washington University School of Medicine, St Louis, MO, 63110, USA)
,
Dong Xinzhong
(The Solomon H. Snyder Department of Neuroscience and Center for Sensory Biology, Johns Hopkins University School of Medicine, Baltimore, MD 21205, USA)
,
Dong Xinzhong
(Howard Hughes Medical Institute, Johns Hopkins University School of Medicine, Baltimore, MD 21205, USA)
資料名:
Neuron
(Neuron)
巻:
93
号:
4
ページ:
840-853.e5
発行年:
2017年
JST資料番号:
T0649A
ISSN:
0896-6273
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)