文献
J-GLOBAL ID:201702247242539840
整理番号:17A1035645
開環と閉環グリッド信頼性の比較【Powered by NICT】
Comparison between open-ring and closed-ring grids reliability
著者 (3件):
Wadi Mohammed
(Electrical Engineering Department, Yildiz Technical University, Davutpas,a St., 34220 Esenler, Istanbul, Turkey)
,
Baysal Mustafa
(Electrical Engineering Department, Yildiz Technical University, Davutpas,a St., 34220 Esenler, Istanbul, Turkey)
,
Shobole Abdulfetah
(Electrical Engineering Department, Yildiz Technical University, Davutpas,a St., 34220 Esenler, Istanbul, Turkey)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
ICEEE
ページ:
290-294
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)