文献
J-GLOBAL ID:201702247316093922
整理番号:17A0606049
集合組織液晶上の固有水素化アモルファスシリコン層のピラミッド状尾根線に沿った局在化暗過電流の導電性原子間力顕微鏡測定
Conductive Atomic Force Microscopy Measurements of Localized over Dark Current along Pyramidal Ridge Lines of Intrinsic Hydrogenated Amorphous Silicon Layer on Textured Crystalline
著者 (10件):
Miwa Hiroyuki
(Environmental and Renewable Energy System Division, Graduate School of Engineering, Gifu University)
,
Nishida Satoshi
(Environmental and Renewable Energy System Division, Graduate School of Engineering, Gifu University)
,
Nishida Satoshi
(Next Generation Energy Research Center, Gifu University)
,
Kanematsu Masato
(Environmental and Renewable Energy System Division, Graduate School of Engineering, Gifu University)
,
Kuribayashi Shizuma
(Environmental and Renewable Energy System Division, Graduate School of Engineering, Gifu University)
,
Win Htay
(Environmental and Renewable Energy System Division, Graduate School of Engineering, Gifu University)
,
Yoshida Norimitsu
(Environmental and Renewable Energy System Division, Graduate School of Engineering, Gifu University)
,
Yoshida Norimitsu
(Next Generation Energy Research Center, Gifu University)
,
Nonomura Shuichi
(Environmental and Renewable Energy System Division, Graduate School of Engineering, Gifu University)
,
Nonomura Shuichi
(Next Generation Energy Research Center, Gifu University)
資料名:
Materials Transactions
(Materials Transactions)
巻:
58
号:
3
ページ:
453-456(J-STAGE)
発行年:
2017年
JST資料番号:
G0668A
ISSN:
1345-9678
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
日本 (JPN)
言語:
英語 (EN)