文献
J-GLOBAL ID:201702248333166221
整理番号:17A1636596
AlGaN/GaNH EMTの表面電位モデルにおける自己発熱とトラッピング効果の実装【Powered by NICT】
Implementation of self-heating and trapping effects in surface potential model of AlGaN/GaN HEMTs
著者 (6件):
Wu Qingzhi
(School of Electronic Engineering, University of Electronic Science and Technology of China, Chengdu, China)
,
Xu Yuehang
(School of Electronic Engineering, University of Electronic Science and Technology of China, Chengdu, China)
,
Wang Zhigang
(School of Electronic Engineering, University of Electronic Science and Technology of China, Chengdu, China)
,
Xia Lei
(School of Electronic Engineering, University of Electronic Science and Technology of China, Chengdu, China)
,
Yan Bo
(School of Electronic Engineering, University of Electronic Science and Technology of China, Chengdu, China)
,
Xu Ruimin
(School of Electronic Engineering, University of Electronic Science and Technology of China, Chengdu, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
IMS
ページ:
236-239
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)