文献
J-GLOBAL ID:201702248835212711
整理番号:17A0449584
シンクロトロンX線微小回折によるカプセル化した薄いシリコン太陽電池における応力プロービングと破壊機構【Powered by NICT】
Probing stress and fracture mechanism in encapsulated thin silicon solar cells by synchrotron X-ray microdiffraction
著者 (10件):
Handara V.A.
(Singapore University of Technology and Design, 487372, Singapore)
,
Handara V.A.
(Center for Solar Photovoltaics Materials & Technology (CPV), Surya University, Tangerang 15810, Indonesia)
,
Radchenko I.
(Singapore University of Technology and Design, 487372, Singapore)
,
Tippabhotla S.K.
(Singapore University of Technology and Design, 487372, Singapore)
,
R.Narayanan Karthic.
(Singapore University of Technology and Design, 487372, Singapore)
,
Illya G.
(Buddhi Dharma University, Tangerang 15115, Indonesia)
,
Kunz M.
(Advanced Light Source (ALS), Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA 94720, United States)
,
Tamura N.
(Advanced Light Source (ALS), Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA 94720, United States)
,
Budiman A.S.
(Singapore University of Technology and Design, 487372, Singapore)
,
Budiman A.S.
(SunPower Corporation, R&D, San Jose, CA 95134, U.S.A.)
資料名:
Solar Energy Materials and Solar Cells
(Solar Energy Materials and Solar Cells)
巻:
162
ページ:
30-40
発行年:
2017年
JST資料番号:
D0513C
ISSN:
0927-0248
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)