文献
J-GLOBAL ID:201702249209500834
整理番号:17A0289444
有限要素法による35nm径のTiN下部電極を持つ相変化ランダムアクセスメモリのシミュレーション
Simulation of Phase-Change Random Access Memory with 35nm diameter of the TiN bottom electrode by Finite Element Modeling
著者 (18件):
JIN Qiuxue
(Shanghai Inst. Microsystem and Information Technol., Chinese Acad. Sci., Shanghai, CHN)
,
JIN Qiuxue
(Univ., Chinese Acad. Sci., Beijing, CHN)
,
LIU Bo
(Shanghai Inst. Microsystem and Information Technol., Chinese Acad. Sci., Shanghai, CHN)
,
LIU Yan
(Shanghai Inst. Microsystem and Information Technol., Chinese Acad. Sci., Shanghai, CHN)
,
WANG Heng
(Shanghai Inst. Microsystem and Information Technol., Chinese Acad. Sci., Shanghai, CHN)
,
WANG Heng
(Univ., Chinese Acad. Sci., Beijing, CHN)
,
XU Zhen
(Shanghai Inst. Microsystem and Information Technol., Chinese Acad. Sci., Shanghai, CHN)
,
XU Zhen
(Univ., Chinese Acad. Sci., Beijing, CHN)
,
GAO Dan
(Shanghai Inst. Microsystem and Information Technol., Chinese Acad. Sci., Shanghai, CHN)
,
GAO Dan
(Univ., Chinese Acad. Sci., Beijing, CHN)
,
WANG Qing
(Shanghai Inst. Microsystem and Information Technol., Chinese Acad. Sci., Shanghai, CHN)
,
WANG Qing
(Univ., Chinese Acad. Sci., Beijing, CHN)
,
XIA Yangyang
(Shanghai Inst. Microsystem and Information Technol., Chinese Acad. Sci., Shanghai, CHN)
,
XIA Yangyang
(Univ., Chinese Acad. Sci., Beijing, CHN)
,
WANG Weiwei
(Shanghai Inst. Microsystem and Information Technol., Chinese Acad. Sci., Shanghai, CHN)
,
WANG Weiwei
(Univ., Chinese Acad. Sci., Beijing, CHN)
,
SONG Zhitang
(Shanghai Inst. Microsystem and Information Technol., Chinese Acad. Sci., Shanghai, CHN)
,
FENG Songlin
(Shanghai Inst. Microsystem and Information Technol., Chinese Acad. Sci., Shanghai, CHN)
資料名:
Proceedings of SPIE
(Proceedings of SPIE)
巻:
9818
ページ:
98180K.1-98180K.5
発行年:
2016年
JST資料番号:
D0943A
ISSN:
0277-786X
CODEN:
PSISDG
資料種別:
会議録 (C)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)