文献
J-GLOBAL ID:201702250399645809
整理番号:17A0964188
低電圧回路遮断器中のアーク/接触移動と電流/電圧を特性化するための新しい方法について【Powered by NICT】
On Novel Methods for Characterizing the Arc/Contact Movement and Its Relation With the Current/Voltage in Low-Voltage Circuit Breaker
著者 (5件):
Li Chunlei
(School of Mechanical and Power Engineering, East China University of Science and Technology, Shanghai, China)
,
Wei Dong
(Department of Experiment Center, Shanghai Electrical Apparatus Research Institute (Group) Co., Ltd, Shanghai, China)
,
Zhang Bing
(Division of Biomedical Engineering, University of Saskatchewan, Saskatoon, SK, Canada)
,
Li Jin
(School of Mechanical and Power Engineering, East China University of Science and Technology, Shanghai, China)
,
Zhang Wenjun
(School of Mechanical and Power Engineering, East China University of Science and Technology, Shanghai, China)
資料名:
IEEE Transactions on Plasma Science
(IEEE Transactions on Plasma Science)
巻:
45
号:
5
ページ:
882-888
発行年:
2017年
JST資料番号:
D0036B
ISSN:
0093-3813
CODEN:
ITPSBD
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)