文献
J-GLOBAL ID:201702251906017749
整理番号:17A1717272
半導体欠陥による二次元エレクトロニクスの設計【Powered by NICT】
Engineering two-dimensional electronics by semiconductor defects
著者 (5件):
Wang Dan
(State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China)
,
Li Xian-Bin
(State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China)
,
Han Dong
(State Key Laboratory of Luminescence and Applications, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China)
,
Tian Wei Quan
(College of Chemistry and Chemical Engineering, Chongqing University, Huxi Campus, Chongqing 401331, China)
,
Sun Hong-Bo
(State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China)
資料名:
Nano Today
(Nano Today)
巻:
16
ページ:
30-45
発行年:
2017年
JST資料番号:
W3114A
ISSN:
1748-0132
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)