文献
J-GLOBAL ID:201702253605218359
整理番号:17A0400959
Si(111)基板上に成長させたSiクラスレート薄膜の断面透過型電子顕微鏡観察【Powered by NICT】
Cross-sectional transmission electron microscope observation of Si clathrate thin films grown on Si (111) substrates
著者 (9件):
Sakai K.
(Center for Collaborative Research & Community Cooperation, University of Miyazaki, 1-1 Gakuen Kibanadai-nishi, Miyazaki, Japan)
,
Takeshita H.
(Faculty of Engineering, University of Miyazaki, 1-1 Gakuen Kibanadai-nishi, Miyazaki, Japan)
,
Haraguchi T.
(Faculty of Engineering, University of Miyazaki, 1-1 Gakuen Kibanadai-nishi, Miyazaki, Japan)
,
Suzuki H.
(Faculty of Engineering, University of Miyazaki, 1-1 Gakuen Kibanadai-nishi, Miyazaki, Japan)
,
Ohashi F.
(Faculty of Engineering, Gifu University, 1-1 Yanagido, Gifu, Japan)
,
Kume T.
(Faculty of Engineering, Gifu University, 1-1 Yanagido, Gifu, Japan)
,
Fukuyama A.
(Faculty of Engineering, University of Miyazaki, 1-1 Gakuen Kibanadai-nishi, Miyazaki, Japan)
,
Nonomura S.
(Faculty of Engineering, Gifu University, 1-1 Yanagido, Gifu, Japan)
,
Ikari T.
(Faculty of Engineering, University of Miyazaki, 1-1 Gakuen Kibanadai-nishi, Miyazaki, Japan)
資料名:
Thin Solid Films
(Thin Solid Films)
巻:
621
ページ:
32-35
発行年:
2017年
JST資料番号:
B0899A
ISSN:
0040-6090
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)