文献
J-GLOBAL ID:201702253749574265
整理番号:17A0114468
短絡故障下の異なる接触状態とGIBプラグインコネクタの温度と電磁力解析【Powered by NICT】
Temperature and electromagnetic force analysis of GIB plug-in connector with different contact status under short circuit fault
著者 (5件):
Guan Xiangyu
(School of Electrical Engineering, Wuhan University, Wuhan, 430072, China)
,
Shu Naiqiu
(School of Electrical Engineering, Wuhan University, Wuhan, 430072, China)
,
Jin Xiao
(School of Electrical Engineering, Wuhan University, Wuhan, 430072, China)
,
Wu Yuanchao
(School of Electrical Engineering, Wuhan University, Wuhan, 430072, China)
,
Peng Hui
(School of Electrical Engineering, Wuhan University, Wuhan, 430072, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
CEFC
ページ:
1
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)