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J-GLOBAL ID:201702253986397295
整理番号:17A0748337
Co/Mo_2C多層ミラー中に埋め込まれたCo層のX線吸収分光法による研究【Powered by NICT】
X-ray absorption spectroscopy study of buried Co layers in the Co/Mo2C multilayer mirrors
著者 (17件):
Yuan Yanyan
(Laboratoire de Chimie Physique-Matiere et Rayonnement, Sorbonne Universites, UPMC Univ Paris 06, Paris, France)
,
Yuan Yanyan
(Laboratoire de Chimie Physique-Matiere et Rayonnement, CNRS UMR 7614, Paris, France)
,
Le Guen Karine
(Laboratoire de Chimie Physique-Matiere et Rayonnement, Sorbonne Universites, UPMC Univ Paris 06, Paris, France)
,
Le Guen Karine
(Laboratoire de Chimie Physique-Matiere et Rayonnement, CNRS UMR 7614, Paris, France)
,
Tu Yuchun
(Laboratoire de Chimie Physique-Matiere et Rayonnement, Sorbonne Universites, UPMC Univ Paris 06, Paris, France)
,
Tu Yuchun
(Laboratoire de Chimie Physique-Matiere et Rayonnement, CNRS UMR 7614, Paris, France)
,
Tu Yuchun
(Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai, 200092, China)
,
Zhu Jingtao
(Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai, 200092, China)
,
Wang Zhanshan
(Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai, 200092, China)
,
Li Wenbin
(Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai, 200092, China)
,
Wen Mingwu
(Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai, 200092, China)
,
Meny Christian
(Institut de Physique et Chimie des Materiaux de Strasbourg, UMR 7504 CNRS-Universite De Strasbourg 23 rue du Loess, 67034, Strasbourg, France)
,
Yu Haisheng
(Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied of Physics Chinese Academy of Sciences, Pudong, Shanghai, 201204, China)
,
Huang Yuying
(Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied of Physics Chinese Academy of Sciences, Pudong, Shanghai, 201204, China)
,
Wei Xiangjun
(Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied of Physics Chinese Academy of Sciences, Pudong, Shanghai, 201204, China)
,
Jonnard Philippe
(Laboratoire de Chimie Physique-Matiere et Rayonnement, Sorbonne Universites, UPMC Univ Paris 06, Paris, France)
,
Jonnard Philippe
(Laboratoire de Chimie Physique-Matiere et Rayonnement, CNRS UMR 7614, Paris, France)
資料名:
Surface and Interface Analysis
(Surface and Interface Analysis)
巻:
49
号:
3
ページ:
205-209
発行年:
2017年
JST資料番号:
E0709A
ISSN:
0142-2421
CODEN:
SIANDQ
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)